1 edition of A Unified Approach for Timing Verification and Delay Fault Testing found in the catalog.
Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.
|Statement||by Mukund Sivaraman, Andrzej J. Strojwas|
|Contributions||Strojwas, Andrzej J.|
|The Physical Object|
|Format||[electronic resource] /|
|Pagination||1 online resource (xv, 155 p.)|
|Number of Pages||155|
|ISBN 10||1461346398, 1441985786|
|ISBN 10||9781461346395, 9781441985781|
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A Unified Approach for Timing Verification and Delay Fault Testing. Authors: Sivaraman, Mukund, Strojwas, Andrzej J. Free Preview. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed.
This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage : Hardcover. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits.
The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. A Unified Approach for Timing Verification and Delay Fault Testing; A Unified Approach to Interior Point Algorithms for Linear Complementarity Problems; A Unified Statistical Methodology for Modeling Fatigue Damage; A Unified Theory of the Nucleus; A Unitary Calculus for Electronic Orbitals; A United Nations High Commissioner for Human Rights.
NOVEL DELAY FAULT TESTING METHODOLOGY USING LOW-OVERHEAD BUILT-IN DELAY SENSOR Fig. (a) Delay sensing scheme (X is the node to be probed).
(b) Timing diagram of the circuit. 2) a TPI algorithm that can identify the strategic nodes where the BIDS can be inserted to increase the fault coverage or reduce the test application time;File Size: KB.
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there could be a large.
Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis.
The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing Cited by: A Validation Fault Model for Timing-InducedFunctional Errors Qiushuang Zhang and Ian G.
Harris Department of Electrical and Computer Engineering University of Massachusetts Amherst, MA [email protected], [email protected] Phone:Fax: Abstract— The violation of timing constraints on signals within.
Provide justification for your answers. Timing for launch-off-capture Transition-delay fault testing Timing for launch-off-shift Transition-delay fault testing (See Prof. Patel’s website for details on Segment Test) * Here we shown some of the commonly used fault models that.
Excessive IR-drop can be detected by Delay Test zProcess Variations Can only be detected by a Delay Test 6 Delay Fault Testing zPropagation delays of all paths in a circuit must be less than the clock period for correct operation. zFunctional tests applied at the operational speed of the circuit are often used to test for delay Size: KB.
Mohan guptha Sivaraman. Path delay fault diagnosis and coverage - A metric and an estimation technique A Unified Approach for Timing Verification and Delay Fault Testing. Article. Jan. Design verification. Design verification is the most important aspect of the product development process illustrated in Figures andconsuming as much as 80% of the total product development time.
The intent is to verify that the design meets the system requirements and specifications. The mechanics of testing for fault simulation, as illustrated in Figureare similar at all levels of testing, including designa set of target faults (fault list) based on the CUT is enumerated.
Often, fault collapsing is applied to the enumerated fault set to produce a collapsed fault set to reduce fault simulation or fault grading time. in delay fault testing is invalid due to circuit electrical phenomena. We iden- tify three delay effects that cause this invalidation and we develop gate-levGl guidelines to account for these effects.
0 We show that our findings have'a profound impact on concepts and techniques used in delai fault testing. Timing Verification of Application Specific Integrated Circuits (ASICs) is a must for all logic designers concerned with the accuracy of timing and clock issues.
About the Author FARZAD NEKOOGAR, formerly a Technical Manager at Intrinsix Corp., has extensive practical experience verifying timing of ASICs, FPGAs, and by: 5. Chapter 4 Mixed Delay and Threshold Voters in Critical Real Chapter 11 Real-Time Testing with Timed Automata Testers and Coverage Criteria Altmetric Badge.
Chapter 12 Monitoring Temporal Properties of Continuous Signals Altmetric Badge. Chapter 13 A Unified Fault-Tolerance Protocol Altmetric Badge. Chapter 14 Automating the Addition of Fail. Test Considerations Analysis of Current Distribution in a Grounding System Induced Current in the Angled Overhead Ground Wire Current Distribution During a Staged Fault Test Transfer Impedances to Communication or Control Cables Step, Touch, and Voltage-Profile Measurements Instrumentation ComponentsFile Size: 2MB.
operational delays, i.e. delay faults that will not give the expected output at the expected time. The other main disadvantage of reducing the supply voltage is performance degradation , resulting in an increase in test application time.
As the voltage is reduced, the operating frequency decreases, and hence the number of test vectors that. Rational Unified Process 10 Waterfall Development Characteristics Delays confirmation of critical risk resolution.
Measures progress by assessing work-products that are poor predictors of time-to-completion. Delays and aggregates integration and testing. Integration Precludes early deployment. Frequently results in major unplanned iterations. Elsevier US Jobcode:0wtp-Prelims p.m.
Page: 5 VLSI TEST PRINCIPLES AND ARCHITECTURES DESIGN FOR TESTABILITY Edited by Laung-Terng Wang Cheng-Wen Wu Xiaoqing Wen AMSTERDAM •BOSTON HEIDELBERG LONDON NEW YORK •OXFORD PARIS SAN DIEGO SAN FRANCISCO •SINGAPORE SYDNEY • TOKYO Morgan Kaufmann Publishers is an imprint of File Size: KB.
Thanks for me share my own love story with VLSI which started 3 years ago. Our relationship has come a long way & I know a bit more of her each day.
The journey has made me understand both the breadth & depth of the subject. Its a very ver.- Automated Testing of the Diagnostic Protocol in ECUs. DiVa is a CANoe extension for automated testing of diagnostic software implementations in ECUs.
Reproducible test cases are generated based on an ECU diagnostic description in CANdela or ODX format. CANoe automatically executes these test cases and generates a conclusive test.Static timing analysis (STA) is a simulation method of computing the expected timing of a digital circuit without requiring a simulation of the full circuit.
High-performance integrated circuits have traditionally been characterized by the clock frequency at which they operate. Measuring the ability of a circuit to operate at the specified speed requires an ability to measure, during the.